Hyperstone hyMap®

hyMap® - New Flash Management Technology

Extended device life-time, high-speed performance, optimized data reliability and power fail safety, reduced system costs

hyMap® is Hyperstone's new enhanced FTL (flash translation layer) mapping approach which improves random write performances, reliability, and endurance significantly. hyMap® permits using cost-efficient MLC flashes where SLC might have been inevitable before. 


  • Lower NAND flash wear-out
  • Extended device life time
  • Enabling MLC Flashes for industrial storage applications
  • High-speed performance, especially for small files and fragmented user data
  • Improved Power-Fail robustness
  • Lower random-write WAF (Write Amplification Factor)
  • Higher Random-Write IOPS (Input/output per second)
  • Optimal Interleaving
  • No external DRAM/SRAM required

Together with Hyperstone’s proprietary hyReliability™ feature set, hyMap® provides enhanced endurance, data retention management, as well as rigorous fail-safe features mandatory for industrial applications.

hyMap® is available for Hyperstone’s S8 - SD/MMC,  U8 - USB 2.0 and U9 - USB 3.1 Flash Memory Controllers and all future Hyperstone products.